New Filters Improve hazardous elements Sensitivity
S/N ratio is improved by adopting two types of new filters that efficiently cut the continuous X-rays component from the X-ray tube. It is possible to measure the trace analysis with high sensitivity by reduction of background which cause worse sensitivity.
Detector Count Rate Increased by Adopting of High-Count-Rate Circuit
The counting system used in the EDX-720 has been modified to process at even high count region than previous system to measure with higher precision.
Particularly in the analysis of resin samples, which generate large numbers of scattered X-rays, and in metal samples, which generate a large amount of fluorescent X-rays from the main component, it has been difficult to get information about trace elements because almost counted signals is for scattered or fluorescent X-rays from the base material. The count rate attained with the EDX-720 is more than twice that of previous models and detection sensitivity is significantly higher. It is possible to reduce time for analysis significantly because the same level of precision can be attained in half the time required with previous models.
Automatic Switching Calibration-Curve Function Identifies Sample Types and Selects Optimum Calibration Curves
In the analysis of plastic samples, the absorption effect of chlorine contained in PVC (polyvinyl chloride) resin gives rise to differences in X-ray fluorescence intensities of PVC samples and PE (polyethylene) samples and, as a result, the calibration curves for each differ greatly. This function switches most suitable calibration curve automatically in one condition file which include some calibration curves for PVC, PE and etc. according to whether the chlorine is contained or not. This makes it unnecessary for the analyst to spend time selecting calibration curves before measurement.
Measurement of Polymer Resin Samples
Analysis of Hazardous Substances in Resin Materials Used in Power-Supply Adapter Casings, Wire-Coating Materials, and Electronic-Device Casings
Thickness and Form Correction Enables High-Precision Analysis of Non-formed Samples
Since X-ray intensity will vary by sample form and thickness, the quantitative result could e different in spite of the same content samples. EDX-series models have a variety of quantitative correction methods as standard features. In particular, the background internal standard correction method enables to get highly precise results by performing quantitative correction calculations that eliminate the influence of sample form and thickness.